ORF5060 Near Field Probe
Optional Accessories

ORF5060 Near Field Probe

  • Designed for EMI and electromagnetic interference measurements
  • Compatible with OWON series spectrum analyzers
  • Detects magnetic field intensity on component surfaces
  • Helps identify magnetic coupling paths
  • Supports analysis of the magnetic environment near electronic modules
  • Enables quick identification of EMI sources
  • Frequency range from 1MHz to 6GHz
  • 50Ω terminal and adaptor impedance
  • SMB(M) terminal
  • N-BNC adaptor
  • BNC-SMB RF cable, approximately 1000mm
  • Operating temperature: 0℃ to 50℃
  • Storage temperature: -20℃ to 70℃
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Overview

The OWON ORF5060 Near Field Probe is used with OWON series spectrum analyzers for electromagnetic interference measurements. It can detect magnetic field intensity on component surfaces, magnetic coupling paths, and the magnetic environment near electronic modules. This allows engineers to quickly locate and analyze EMI sources during electronic design, troubleshooting, and electromagnetic compatibility testing. The probe operates over a frequency range of 1MHz to 6GHz and uses a 50Ω terminal and adaptor impedance. It is supplied with an SMB(M) terminal, N-BNC adaptor, and approximately 1000mm BNC-SMB RF cable.

Specifications
FrequencyFrequency Range1MHz ~ 6GHz
ConnectionTerminal TypeSMB(M)
AdaptorN-BNC
RF CableBNC-SMB, approximately 1000mm
ElectricalTerminal and Adaptor Impedance50Ω
EnvironmentalOperating Temperature0℃ ~ 50℃
Storage Temperature-20℃ ~ 70℃
MechanicalDimensionsNot specified in the provided specifications
WeightNot specified in the provided specifications