
The XDS4000 Series delivers high bandwidth up to 500MHz with a 5GSa/s sampling rate, ensuring accurate signal capture. With its 400MB deep memory and high waveform refresh rate, engineers can easily detect rare events. The built-in waveform generator and advanced analysis tools such as FFT and Bode plot make it ideal for R&D, maintenance, and education. Its multi-touch interface and rich connectivity options provide a modern and efficient user experience.
| Oscilloscope | Models | XDS4352, XDS4502, XDS4354, XDS4504 |
| Bandwidth | 350MHz / 500MHz | |
| Sample Rate | 5 GSa/s | |
| Channels | 2 or 4 | |
| Horizontal Scale | 500ps/div – 1000s/div (1-2-5 step) | |
| Record Length | 400M | |
| Waveform Refresh Rate | 600,000 wfms/s | |
| Vertical Sensitivity | 1mV/div – 10V/div (1MΩ), 1mV/div – 1V/div (50Ω) | |
| Vertical Resolution | 8-bit ADC | |
| Input Impedance | 1MΩ ±2% || 15pF ±5pF, 50Ω ±2% | |
| Input Coupling | DC, AC, Ground | |
| Trigger | Trigger Types | Edge, Video, Pulse, Slope, Runt, Window, Timeout, Nth Edge, Logic, I2C, SPI, RS232, CAN |
| Decoding | Bus Decode (Optional) | RS232, I2C, SPI, CAN |
| Measurement | Automatic Measurements | Frequency, Period, RMS, Peak-to-Peak, Rise/Fall Time, Duty Cycle, Phase, Area, Pulse Count and more (50+ types) |
| Math Functions | Operations | +, −, ×, ÷, FFT, Integration, Differentiation, Square Root, User-defined, Digital Filters (LPF, HPF, BPF, BRF) |
| Display | Screen | 10.4-inch LCD multi-touch display |
| Storage | Waveform Storage | 100 waveforms |
| Interfaces | Connectivity | USB Host, USB Device, LAN, VGA, EXT Trigger In, Pass/Fail Output |
| Physical | Dimensions | 422 × 226 × 135 mm |
| Weight | Approx. 5 kg | |
| Waveform Generator | Max Frequency | 50 MHz |
| Sample Rate | 250 MS/s | |
| Resolution | 14-bit | |
| Amplitude Range | 2mVpp – 5Vpp (≤50MHz), up to 20Vpp (≤25MHz) | |
| Waveforms | Sine, Square, Pulse, Ramp, Noise, Exponential, Sin(x)/x, Step + 64 built-in + Arbitrary | |
| Multimeter (Optional) | Resolution | 4½ digits |
| Functions | Voltage, Current, Resistance, Capacitance, Frequency, Duty Cycle, Continuity, Diode Test |